I’m trying to interprete the smart values from my cfast card, can somebody help me. And whats the TBW of a cfast card?
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.8.0-23-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SanDisk SDCFSP-512G
Serial Number: xxxxxxx
LU WWN Device Id: xxxxxx
Firmware Version: CF1504AR
User Capacity: 512.124.518.400 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 1.8 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Aug 21 12:33:46 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 22) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0032 100 100 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 25
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59
165 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
166 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 4
167 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 62
168 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 4
169 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 191
170 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 0
171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
173 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 4
174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 63
184 End-to-End_Error 0x0032 100 100 --- Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 --- Old_age Always - 0
194 Temperature_Celsius 0x0022 062 060 000 Old_age Always - 38 (Min/Max 20/60)
199 UDMA_CRC_Error_Count 0x0032 100 100 --- Old_age Always - 0
230 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 851981
232 Available_Reservd_Space 0x0033 100 100 005 Pre-fail Always - 100
233 Media_Wearout_Indicator 0x0032 100 100 --- Old_age Always - 276
234 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
241 Total_LBAs_Written 0x0030 253 253 000 Old_age Offline - 1531
242 Total_LBAs_Read 0x0030 100 100 000 Old_age Offline - 4747
244 Unknown_Attribute 0x0032 000 100 --- Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.